In this present study, Zn1-xCoxO (x = 0.0, 0.04 & 0.06) samples were synthesized using conventional solid state sintering process and characterized by PXRD and SEM. The structural analysis was done using Rietveld profile refinement technique. The chemical bonding features and nature between Zn and O atoms was analyzed by charge distribution studies. The bonding between Zn and O is clearly visible in the three- dimensional and two-dimensional MEM maps. One- dimensional charge density distribution analysis clearly reveals that the characteristics of the bond. MEM results were also correlated with the PXRD parameters.
CITATION STYLE
Structural and Bonding Behavior Analysis of Microwave Sintered ZnO:Co materials. (2019). International Journal of Innovative Technology and Exploring Engineering, 9(2S2), 268–270. https://doi.org/10.35940/ijitee.b1198.1292s219
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