From crystal to crystal comparison, the d 220 lattice spacing in PERFX and WASO silicon crystals used in the only two existing absolute measurements have been found to be equal within ±2×10 -7 d 220. This demonstrates that generic variabilities of the two crystals account only for a small part of the 1.8×10 -6 d 220 difference in the two absolute measurements. In a new series of 336 single measurements, our d 220 value reported recently has been confirmed within ±2×10 -8 d 220. From these results we derive the following lattice parameter for highly pure silicon single crystals:a 0 =(543 102.018±0.034) fm (at 22.5°C, in vacuum). © 1982 Springer-Verlag.
CITATION STYLE
Becker, P., Scyfried, P., & Siegert, H. (1982). The lattice parameter of highly pure silicon single crystals. Zeitschrift Für Physik B Condensed Matter, 48(1), 17–21. https://doi.org/10.1007/BF02026423
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