Fault recovery technique for TMR softcore processor system using partial reconfiguration

Abstract

System LSI is used for the dependable system, such as in-vehicle system. However, the miniaturization of semiconductor manufacturing process degrades the system dependability. We focus attention on SRAM-based FPGAs (Field Programmable Gate Arrays) which can implement the arbitrary circuits. However, FPGAs are vulnerable to a soft-error, which is induced by the radiation effects. Therefore, we propose the reliable system which can recover both soft-error and hard-error. As a result, we can design the reliable system for both soft-error and hard-error. © 2012 Springer-Verlag.