Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
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APA
Kaiser, U., Meyer, J., Biskupek, J., Leschner, J., Khlobystov, A., Müller, H., … Benner, G. (2010). High Resolution 20kV Transmission Electron Microscopy of Nanosystems – First Results Towards Sub Ångstrøm Low Voltage EM (SALVE – Microscopy). Microscopy and Microanalysis, 16(S2), 1702–1703. https://doi.org/10.1017/s1431927610060496
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