High Resolution 20kV Transmission Electron Microscopy of Nanosystems – First Results Towards Sub Ångstrøm Low Voltage EM (SALVE – Microscopy)

U Kaiser; J Meyer; J Biskupek; J Leschner; AN Khlobystov; H Müller; P Hartel; M Haider; S Eyhusen; G Benner

Journal ArticleOPEN ACCESS

High Resolution 20kV Transmission Electron Microscopy of Nanosystems – First Results Towards Sub Ångstrøm Low Voltage EM (SALVE – Microscopy)

Kaiser U
Meyer J
Biskupek J
et al.

Microscopy and Microanalysis (2010) 16(S2) 1702-1703

DOI: 10.1017/s1431927610060496

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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APA

Kaiser, U., Meyer, J., Biskupek, J., Leschner, J., Khlobystov, A., Müller, H., … Benner, G. (2010). High Resolution 20kV Transmission Electron Microscopy of Nanosystems – First Results Towards Sub Ångstrøm Low Voltage EM (SALVE – Microscopy). Microscopy and Microanalysis, 16(S2), 1702–1703. https://doi.org/10.1017/s1431927610060496

High Resolution 20kV Transmission Electron Microscopy of Nanosystems – First Results Towards Sub Ångstrøm Low Voltage EM (SALVE – Microscopy)

Abstract

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