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Advancing Characterization of Materials with Atomic Force Microscopy-Based Electric Techniques

  • Magonov S
  • Alexander J
  • Wu S
Springer New York, (2010), 233-300
DOI: 10.1007/978-1-4419-7167-8_9
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Abstract

Abstract Multifrequency measurements in atomic force microscopy (AFM) are one of the main techniques advancing this method. Detection of the AFM probe response at different frequencies enables simultaneous and independent studies of individual constituents of ...

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Magonov, S., Alexander, J., & Wu, S. (2010). Advancing Characterization of Materials with Atomic Force Microscopy-Based Electric Techniques. In Scanning Probe Microscopy of Functional Materials (pp. 233–300). Springer New York. https://doi.org/10.1007/978-1-4419-7167-8_9

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