Advanced applications of NEXAFS spectroscopy for functionalized surfaces

Abstract

Spectroscopic techniques based on the use of synchrotron radiation have significantly contributed to a better understanding of macroscopic as well as of microscopic properties of materials. One of them is near edge X-ray absorption fine structure (NEXAFS) spectroscopy, a source of valuable information on the electronic structure and orientation of molecular adsorbates on metal surfaces. NEXAFS spectroscopy has had its largest impact in connection with an electron-based detection of the photon absorption, which turns this technique in a highly surface sensitive method. The technique has been developed over the past 30 years and presently is routinely used to study the adsorption of organic molecules on a large variety of different substrates, including metals, oxides and polymers. In the last decades, in addition to above-mentioned systems, the spectroscopic characterization of nanostructures has become an important topic. The present contribution describes the basics of NEXAFS spectroscopy and demonstrates the potential of the method by discussing several case studies. © Springer-Verlag Berlin Heidelberg 2013.