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Characterization of Nano-Crystalline Materials Using Electron Backscatter Diffraction in the Scanning Electron Microscope

  • Michael J
Kluwer Academic Publishers, (2006), 401-425
DOI: 10.1007/1-4020-8006-9_13
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Abstract

EBSD should now be considered a standard analytical accessory for the SEM. The spatial resolution of EBSD is quite high (as high as a few nm, depending upon material) and is suitable for the study of many nano-crystalline materials. For applications of EBSD where the...

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Michael, J. R. (2006). Characterization of Nano-Crystalline Materials Using Electron Backscatter Diffraction in the Scanning Electron Microscope. In Handbook of Microscopy for Nanotechnology (pp. 401–425). Kluwer Academic Publishers. https://doi.org/10.1007/1-4020-8006-9_13

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