Complete pose binary SIFT for face recognition with pose variation

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Abstract

Some pose invariant face recognition approaches require preprocessing such as face alignment or landmark fitting, which is another unresolved problem. SIFT based face recognition schemes could resolve the problem of constrained pose variation without such preprocessing. we find that the sift descriptors are robust to off-plane rotation within 25 degree and in-plane rotation. Furthermore, we propose complete pose binary SIFT (CPBS) to address the issue of arbitrary pose variation. First, five face images with poses of frontal view, rotation left/right 45 and 90 degree respectively are selected as gallery images of a subject. Then the binary descriptors of these images are pooled together as CPBS of the subject. Face recognition is finished by hamming distance between the probe face image and the CPBS. Experimental results on the CMU-PIE and FERET face databases show that our approach has performance comparable to state-of-the-art approaches, while not requiring face alignment or landmark fitting. © Springer International Publishing 2013.

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Wu, L., Zhou, P., Hou, Y., Cao, H., Ma, X., & Zhang, X. (2013). Complete pose binary SIFT for face recognition with pose variation. In Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) (Vol. 8232 LNCS, pp. 71–80). https://doi.org/10.1007/978-3-319-02961-0_9

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