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Book Chapter

POINT DEFECTS IN Si-SiO2 SYSTEMS: CURRENT UNDERSTANDING

  • Karna S
  • Kurtz H
  • Pineda A
  • et al.
Springer Netherlands, (2000), 599-615
DOI: 10.1007/978-94-010-0944-7_23
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Karna, S. P., Kurtz, H. A., Pineda, A. C., Shedd, W. M., & Pugh, R. D. (2000). POINT DEFECTS IN Si-SiO2 SYSTEMS: CURRENT UNDERSTANDING. In Defects in SiO2 and Related Dielectrics: Science and Technology (pp. 599–615). Springer Netherlands. https://doi.org/10.1007/978-94-010-0944-7_23

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