Material characterization in the wide field of optoelectronics often involves ellipsometric measurements. A deep knowledge of the sample properties, including anisotropy, is required for successful material analysis via optical modeling. This appendix provides thin-film optical constants n and k for commonly used organic materials used for transparent electrodes, solar cells, etc.
CITATION STYLE
Furchner, A., & Aulich, D. (2018). Organic Materials for Optoelectronic Applications. In Springer Series in Surface Sciences (Vol. 52, pp. 529–538). Springer Verlag. https://doi.org/10.1007/978-3-319-75895-4_24
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