Characterization of Thin Organic Films with Surface-Sensitive FTIR Spectroscopy

Abstract

This chapter reviews the role of infrared spectroscopy in characterization of surfaces and interfaces of thin organic films. FTIR spectroscopy is widely utilized in studies of chemical bonds addressing questions concerning organization and orientation of the molecules in those films. In-situ FTIR spectroscopy frequently aids in studies of chemical reactions under a variety of experimental conditions, from high vacuum to aqueous solutions. FTIR spectroscopy can be realized in a multitude of setup geometries sensitive to a small amount of surface adsorbates. Anisotropic film properties can be studied by incorporating polarizing optics in an FTIR setup. FTIR modes of operation discussed in this chapter are Attenuated Total Reflection (ATR), transmission and reflection of the IR radiation through (or from) the sample, Polarization Modulation Infrared Reflection Absorption Spectroscopy (PM-IRRAS) and Infrared Spectroscopic Ellipsometry (IRSE). Practical considerations related to the sample properties (such as doping or roughness) and to the measurement conditions are discussed.