Analysis of global data education and patent activity using new methods of pattern analysis

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Abstract

This paper study the world of education data and patent activity for the period of 1979-2006 years using the latest methods of pattern analysis: a linear pattern-classification and ordinal-invariant pattern clustering. Attempt is made to reflect the situation regarding primary, secondary and higher education in 37 countries. © 2014 Published by Elsevier B.V.

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Myachin, A. (2014). Analysis of global data education and patent activity using new methods of pattern analysis. In Procedia Computer Science (Vol. 31, pp. 468–473). Elsevier B.V. https://doi.org/10.1016/j.procs.2014.05.291

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