This paper study the world of education data and patent activity for the period of 1979-2006 years using the latest methods of pattern analysis: a linear pattern-classification and ordinal-invariant pattern clustering. Attempt is made to reflect the situation regarding primary, secondary and higher education in 37 countries. © 2014 Published by Elsevier B.V.
Myachin, A. (2014). Analysis of global data education and patent activity using new methods of pattern analysis. In Procedia Computer Science (Vol. 31, pp. 468–473). Elsevier B.V. https://doi.org/10.1016/j.procs.2014.05.291