CITATION STYLE
Verleysen, E., Richard, O., Bender, H., Schryvers, D., & Vandervorst, W. (2009). Chemical analysis of nickel silicides with high spatial resolution by combined EDS and EELS (ELNES). In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 455–456). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_228
Mendeley helps you to discover research relevant for your work.