Adaptive visual detection of industrial product defects

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Abstract

Visual inspection of the appearance defects on industrial products has always been a research hotspot pursued by industry and academia. Due to the lack of samples in the industrial defect dataset and the serious class imbalance, deep learning technology cannot be directly applied to industrial defect visual inspection to meet the real application needs. Transfer learning is a good choice to deal with insufficient samples. However, cross-dataset bias is unavoidable during simple knowledge transfer. We noticed that the appearance defects of industrial products are similar, and most defects can be classified as stains or texture jumps, which provides a research basis for building a universal and adaptive industrial defect detection model. In this article, based on the idea of model-agnostic meta-learning (MAML), we propose an adaptive industrial defect detection model through learning from multiple known industrial defect datasets and then transfer it to the novel anomaly detection tasks. In addition, the Siamese network is used to extract differential features to minimize the influence of defect types on model generalization, and can also highlight defect features and improve model detection performance. At the same time, we add a coordinate attention mechanism to the model, which realizes the feature enhancement of the region of interest in terms of two coordinate dimensions. In the simulation experiments, we construct and publish a visual defect dataset of injection molded bottle cups, termed BC defects, which can complement existing industrial defect visual data benchmarks. Simulation results based on BC defects dataset and other public datasets have demonstrated the effectiveness of the proposed general visual detection model for industrial defects. The dataset and code are available at https://github.com/zhg-SZPT/MeDetection.

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APA

Zhang, H., Wang, D., Chen, Z., & Pan, R. (2023). Adaptive visual detection of industrial product defects. PeerJ Computer Science, 9, 1–23. https://doi.org/10.7717/PEERJ-CS.1264

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