Studies on SEE Characteristic and Hardening Techniques of CMOS SRAM with Sub-micro Feature Sizes

Xing-hua, H., Cong, Z., Yong-liang, Z., & Huan-zhang, L. (2010). Studies on SEE Characteristic and Hardening Techniques of CMOS SRAM with Sub-micro Feature Sizes. In Advanced Techniques in Computing Sciences and Software Engineering (pp. 191–196). Springer Netherlands. https://doi.org/10.1007/978-90-481-3660-5_33