Systematic characterization of random telegraph noise and its dependence with magnetic fields in MOSFET devices

Marquez, C., Huerta, O., Tec-Chim, A. I., Guarin, F., Gutierrez-D, E. A., & Gamiz, F. (2020). Systematic characterization of random telegraph noise and its dependence with magnetic fields in MOSFET devices. In Noise in Nanoscale Semiconductor Devices (pp. 135–174). Springer International Publishing. https://doi.org/10.1007/978-3-030-37500-3_4