Abstract
Temperature characteristic is one of the important characteristics in vertical-cavity surface-emitting lasers (VCSELs), and it directly effects on the photo-electricity characteristics of semiconductor lasers. So a new electrode structure VCSEL is proposed and demonstrated. In order to study temperature variation of the 808 nm VCSEL, opto-electricity is measured by changing the temperature of heat sink. The testing results show that new electrode structure VCSEL characteristic is better than the traditional structure ones.
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CITATION STYLE
Feng, Y., Feng, D., Liu, P., Ma, X., Hao, Y., Liu, G., … Li, Y. (2016). 808 nm VCSELs temperature characteristic study. In Lecture Notes in Electrical Engineering (Vol. 348, pp. 799–805). Springer Verlag. https://doi.org/10.1007/978-81-322-2580-5_72
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