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Book Chapter

Defect Formation and Reduction During Bulk SiC Growth

  • Ohtani N
  • Katsuno M
  • Fujimoto T
  • et al.
DOI: 10.1007/978-3-642-18870-1_6
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Ohtani, N., Katsuno, M., Fujimoto, T., & Yashiro, H. (2004). Defect Formation and Reduction During Bulk SiC Growth (pp. 137–162). https://doi.org/10.1007/978-3-642-18870-1_6

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