The point spread function assessment of MeV electron imaging quality for thick specimens

  • Wang F
  • Zhang H
  • Cao M
  • et al.
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Wang, F., Zhang, H.-B., Cao, M., Nishi, R., Yoshida, K., & Takaoka, A. (2009). The point spread function assessment of MeV electron imaging quality for thick specimens. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 343–344). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_172

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