Leaf Recognition Based on Elliptical Half Gabor and Maximum Gap Local Line Direction Pattern

Abstract

Plant identification via leaf images is very meaningful to agricultural information. The existing methods were based on one or two kinds of the three distinct characteristics in leaf images including leaf contours, textures and veins. This limits their recognition performance and scope of application. This paper describes a novel counting-based leaf recognition method, which can directly and effectively combine all of the three kinds of significant characteristics in leaf images. In order to obtain the stable and independent local line responses from leaf contour, texture and vein, elliptical half Gabor is introduced and convoluted with the raw grayscale leaf images, and then maximum gap local line direction patterns are extracted from the local line responses and normalized in direction by cyclically right shifting these patterns until the most numerous bit plane with a value of 1 to the left bit. The histogram of the normalized patterns is calculated and regarded as the counting-based local structure descriptor, and support vector machine is utilized as the classifier. Experimental results on three frequently used leaf databases show that the proposed approach yields a better performance in terms of the classification accuracy, applicability and feasibility in comparison with the state of the art methods.