We compare the crystallization behavior of thin films of Ge2Sb2.3Te5 in various amorphous states, namely, as-deposited, melt-quenched, and primed. These films are embedded in a quadrilayer stack similar in structure to the commercially available phase-change optical disks. This study shows that the melt-quenched amorphous film has a shorter crystallization onset time and a higher crystallization rate in comparison to the as-deposited amorphous film. We also observed that variable priming leads to crystallization behavior falling between that of the as-deposited and melt-quenched states. A qualitative model of the modification in crystallization behavior due to priming is given based on the notion that priming produces crystalline embryos which hastens crystallization process. © 2000 American Institute of Physics.
CITATION STYLE
Khulbe, P. K., Wright, E. M., & Mansuripur, M. (2000). Crystallization behavior of as-deposited, melt quenched, and primed amorphous states of Ge2Sb2.3Te5 films. Journal of Applied Physics, 88(7), 3926–3933. https://doi.org/10.1063/1.1289811
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