Time-resolved x-ray diffraction of GaAs with a 20-fs, laser-driven plasma source

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Abstract

Laboratory-scale, optical pump/x-ray probe measurements are used to measure GaAs lattice dynamics following excitation with a 25-fs, 800-nm pulse.

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Jimenez, R., Rose-Petruck, C., Guo, T., Wilson, K. R., & Barty, C. P. J. (1998). Time-resolved x-ray diffraction of GaAs with a 20-fs, laser-driven plasma source. Springer Series in Chemical Physics, 63, 404–406. https://doi.org/10.1007/978-3-642-72289-9_121

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