The preparation of a planar FeRh thin film using a focused ion beam (FIB) secondary electron microscope (SEM) for the purpose of in situ transmission electron microscopy (TEM) is presented. A custom SEM stub with 45° faces allows for the transfer and milling of the sample on a TEM heating chip, whilst Fresnel imaging within the TEM revealed the presence of the magnetic domain walls, confirming the quality of the FIB-prepared sample.
CITATION STYLE
Almeida, T. P., McGrouther, D., Pivak, Y., Perez Garza, H. H., Temple, R., Massey, J., … McVitie, S. (2017). Preparation of high-quality planar FeRh thin films for in situ TEM investigations. In Journal of Physics: Conference Series (Vol. 903). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/903/1/012022
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