The metal-oxide-semiconductor (MOS) capacitor is an important structure, which is incorporated in the surface of most semiconductor devices. It forms an essential part of a MOSFET which in turn is an important device used in large-scale integration. A simple physical approach applied to MOS structure and a behavior of ideal MOS capacitor, which are necessary for understanding the analyses that will follow subsequently, are described in Sect. 2 and 3, respectively. Then, the background study of the actual (non-ideal) MOS structure by taking into consideration oxide charges and work function difference is presented in Sect. 4.
CITATION STYLE
Bentarzi, H. (2011). The MOS Structure. In Engineering Materials (pp. 5–16). Springer Science and Business Media B.V. https://doi.org/10.1007/978-3-642-16304-3_2
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