Teraherz pulse near-field microscopes

Abstract

We review the recent progress in the terahertz (THz) apertureless near-field microscopes. We demonstrate quantitative analysis and measurements of the THz near-fields interactions in the probe-sample system. We also present a self-consistent line dipole image method for the quantitative analysis of the near-field interaction. The measurements of approach curves and relative contrasts on gold and silicon substrates were in excellent agreement with calculations based on the self-consistent line dipole image method.