Femtosecond time-resolved HAXPES

Abstract

The problems, progress, and prospects of time-resolved hard X-ray photoelectron spectroscopy (TR-HAXPES) using X-ray free-electron laser (XFEL) radiation are discussed. This novel photoemission technique is characterized by a unique combination of femtosecond time resolution and bulk sensitivity with momentum selectivity and sensitivity to the atomic site-specific chemical and structural environment. TR-HAXPES will in particular enable us to simultaneously study the ultrafast electron and structural dynamics in the bulk of complex materials and electronic devices.