CITATION STYLE
Si, M., Li, X., Wu, W., Alghamdi, S., & Ye, P. (2020). Low-frequency noise in III-V, Ge, and 2D transistors. In Noise in Nanoscale Semiconductor Devices (pp. 335–357). Springer International Publishing. https://doi.org/10.1007/978-3-030-37500-3_10
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