CITATION STYLE
Grillo, V., Carlino, E., Ciasca, G., Seta, M. D., & Ferrari, C. (2008). On the Role of Specimen Thickness in Chemistry Quantification by HAADF. In Microscopy of Semiconducting Materials 2007 (pp. 173–176). Springer Netherlands. https://doi.org/10.1007/978-1-4020-8615-1_37
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