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Origins of 1/f noise in electronic materials and devices: A historical perspective

Springer International Publishing, (2020), 1-31
DOI: 10.1007/978-3-030-37500-3_1
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Fleetwood, D. M. (2020). Origins of 1/f noise in electronic materials and devices: A historical perspective. In Noise in Nanoscale Semiconductor Devices (pp. 1–31). Springer International Publishing. https://doi.org/10.1007/978-3-030-37500-3_1

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