CITATION STYLE
Meyer, E., Lüthi, R., Howald, L., Bammerlin, M., Guggisberg, M., & Güntherodt, H.-J. (1997). Instrumental Aspects and Contrast Mechanisms of Friction Force Microscopy. In Micro/Nanotribology and Its Applications (pp. 193–215). Springer Netherlands. https://doi.org/10.1007/978-94-011-5646-2_12
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