Test strategies for multivoltage designs

Abstract

Reducing the power consumption of digital designs through the use of more than one Vdd value (multivoltage) is known and well practiced. Some manufacturing defects have Vdd dependency, which implies that defects can become active only at certain power supply setting, leading to reduced defect coverage. This chapter presents a coherent overview of recently reported research in testing strategies for multivoltage designs including defect modeling, test generation, and DFT solutions. The chapter also outlines number of worthy research problems that need to be addressed to develop high-quality and cost-effective test solutions for multi-Vdd designs. © 2010 Springer-Verlag US.