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Lattice Location Determination of Ge in SiC by ALCHEMI

  • Kups T
  • Voelskow M
  • Skorupa W
  • et al.
Springer Netherlands, (2008), 353-358
DOI: 10.1007/978-1-4020-8615-1_78
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Kups, T., Voelskow, M., Skorupa, W., Soueidan, M., Ferro, G., & Pezoldt, J. (2008). Lattice Location Determination of Ge in SiC by ALCHEMI. In Microscopy of Semiconducting Materials 2007 (pp. 353–358). Springer Netherlands. https://doi.org/10.1007/978-1-4020-8615-1_78

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