CITATION STYLE
Moldovan, G., Li, X., Wilshaw, P., & Kirkland, A. I. (2009). Direct electron detectors for TEM. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 85–86). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_43
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