Superlattice growth via MBE and green's function techniques

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Abstract

A model has been developed to simulate the growth of arrays consisting of a substrate on which alternating layers of quantum dots (QDs) and spacer layers are epitaxially grown. The substrate and spacer layers are modeled as an anisotropic elastic half-space, and the QDs are modeled as point inclusions buried within the half-space. In this model, the strain at the free surface of this half-space due to the buried point QDs is calculated, and a scalar measure of the strain at the surface is subsequently determined. New point QDs are placed on the surface where the previously calculated scalar strain measure is a minimum. Following available DFT results, this scalar strain measure is a weighted average of the in-plane strains. This model is constructed under the assumption that diffusional anisotropy can be neglected, and thus, the results are more in agreement with results from experiments of growth of SiGe QDs than experiments involving QDs of (In,Ga)As. © 2010 The Author(s).

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APA

Ramsey, J. J., Pan, E., Chung, P. W., & Wang, Z. M. (2010). Superlattice growth via MBE and green’s function techniques. Nanoscale Research Letters, 5(8), 1272–1278. https://doi.org/10.1007/s11671-010-9636-8

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