As already explained in the introduction to Chap., the development of economically feasible nanoelectronic systems requires a tight interplay between materials and fabrication technologies on the one hand and design technologies on the other. In particular, it is quite essential to explore circuit-level measures to mitigate the limitations of process variations (PVs), leakage, and reduced device reliability and, finally, to explore system-level design approaches that are better adapted to the constraints imposed by the materials, technology, and device physics. This chapter largely deals with some of these key questions that relate to design technologies for nanoelectronic systems. © Springer Science+Business Media LLC 2009.
CITATION STYLE
Jamaa, H. B., Boroujeni, B. K., De Micheli, G., Leblebici, Y., Piguet, C., Schmid, A., & Stanisavljevic, M. (2009). Design technologies for nanoelectronic systems beyond ultimately scaled CMOS. In Nanosystems Design and Technology (pp. 45–84). Springer US. https://doi.org/10.1007/978-1-4419-0255-9_3
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