Resonant Soft X-ray Scattering of Polymers with a 2D Detector: Initial Results and System Developments at the Advanced Light Source

Abstract

Most advanced applications of polymers rely on heterogeneous structures or specific interfacial properties to yield desired performance and functionalities. Rational design and application require that these structures be characterized. Recently, it has been demonstrated that soft x-ray scattering is a unique complementary technique to conventional hard x-ray and neutron scattering and an excellent tool for polymer structure determination with improved chemical sensitivity. Efforts to enhance the capabilities and efficiency of soft x-ray scattering through the use of a CCD detector will be delineated and first results presented. Development of a dedicated setup at beamline 11.0.1.2 of the Advanced Light Source will be described. This set-up has an elliptically polarized undulator as a source, which offers complete polarization control and hence unique capabilities.