Intentional control of n-type conduction for Si-doped AlN and Al XGa1-XN (0.42≤x<1)

Abstract

We have obtained n-type conductive Si-doped AlN and AlXGa 1-XN with high Al content (0.42≤x<1) in metalorganic vapor phase epitaxy by intentionally controlling the Si dopant density, [Si]. Si-doped AlN showed the n-type conduction when [Si] was less than 3×10 19cm-3. When [Si] was more than 3×10 19cm-3, it became highly resistive due to the self-compensation of Si donors. This indicates that the self-compensation plays an important role at higher [Si] and determines the upper doping limit of Si for the AlN and AlXGa1-XN. For x≥0.49, the ionization energy of Si donors increased sharply with increasing Al content. These resulted in a sharp decrease in the highest obtainable electron concentration with increasing Al content for the Si-doped AlXGa1-XN. © 2002 American Institute of Physics.