Deformation mapping at the microstructural length scale

Abstract

Digital Image Correlation (DIC) experiments performed in a scanning electron microscope (SEM) allow for deformation mapping at length scales not possible with optical cameras. This paper presents the development of a new experimental methodology to map full-field surface deformations at the microstructural level. The results obtained through this approach when combined with electron backscatter diffraction (EBSD) microstructure maps enable linking of the deformation behavior to the underlying microstructure as the material is thermo-mechanically loaded. This paper will address the challenges associated with this technique including surface patterning at the nano- and micro-scale, image distortion correction, and dealing with stress relaxation that occurs over long SEM frame scans. © The Society for Experimental Mechanics, Inc. 2013.