New Trend in Application of Synchrotron Radiation-Induced X-ray Fluorescence Analysis to Archaeology

  • Nakai I
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Abstract

X-ray fluorescence (XRF) analysis is a well-established analytical method of archaeological objects enabling non-destructive multi-elemental analysis of the objects. X-ray tubes have been used as a principal excitation source of the conventional XRF spectrometers. Recent development of Synchrotron Radiation (SR) technology induced large advances in the X-ray fluorescence analysis of various materials. Characteristic properties of synchrotron radiation led to a number of new XRF techniques, which could not be realized by using conventional X-ray sources.

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Nakai, I. (2005). New Trend in Application of Synchrotron Radiation-Induced X-ray Fluorescence Analysis to Archaeology. In X-rays for Archaeology (pp. 183–198). Springer-Verlag. https://doi.org/10.1007/1-4020-3581-0_12

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