A method for the development of a test plan for BIST-based exhaustive testing of a circuit implemented with an in-system reconfigurable FPGA is presented. A test plan for application-dependent testing of an FPGA is based on the concept of a logic cone and linear segment. Linear segments that satisfy single- or multi-generator compatibility requirement can be combinationally exhaustively tested concurrently and are merged into a test block. Two methods for merging logic cones and linear segments are proposed. Experimental results are presented.
CITATION STYLE
Tomaszewicz, P. (2000). Self-testing of linear segments in user-programmed FPGAs. In Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) (Vol. 1896, pp. 169–174). Springer Verlag. https://doi.org/10.1007/3-540-44614-1_19
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