CITATION STYLE
Ohno, S. Y., Shudo, K. I., & Tanaka, M. (2014). Real-time analysis of initial oxidation process on Si(001) by means of surface differential reflectance spectroscopy and reflectance difference spectroscopy. Springer Series in Optical Sciences, 180, 29–44. https://doi.org/10.1007/978-3-642-40594-5_2
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