In this study, we propose a simple, yet general and powerful framework for constructing accurate affine invariant regions and use it for near-duplicate detection problem. In our framework, a method for extracting reliable seed points is first proposed. Then, regions which are invariant to most common affine transformations are extracted from seed points by a new method named the Thresholding Seeded Growing Region (TSGR). After that, an improved ellipse fitting method based on the Direct Least Square Fitting (DLSF) is used to fit the irregularly-shaped contours of TSGRs to obtain ellipse regions as the final invariant regions. At last, SIFT-PCA descriptors are computed on the obtained regions. In the experiment, our framework is evaluated by retrieving near-duplicate in an image database containing 1000 images. It gives a satisfying result of 96.8% precision at 100% recall. © Springer-Verlag Berlin Heidelberg 2007.
CITATION STYLE
Tian, L., & Kamata, S. I. (2007). Near-duplicate detection using a new framework of constructing accurate affine invariant regions. In Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) (Vol. 4781 LNCS, pp. 61–72). Springer Verlag. https://doi.org/10.1007/978-3-540-76414-4_7
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