Relation between the adhesion strength and interfacial width for symmetric polystyrene bilayers

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Abstract

Polystyrene (PS) bilayers were prepared and were adhered at a temperature between the surface and bulk glass-transition temperatures for a given time. Then, the interfacial adhesion strength (GL) was examined with a conventional lapshear measurement. GL first increased with increasing adhesion time and then reached a constant value. This result implied that the segments moved across the interface, to a certain depth, even at a temperature below the bulk glass-transition temperature. To confirm this, the interfacial evolution for the PS/deuterated PS bilayers was examined with dynamic secondary-ion mass spectrometry. The GL value was linearly proportional to the thickness of the interfacial adhesion layer. Finally, we propose a strategy for regulating the adhesion strength based on the chain-end chemistry. © 2006 Wiley Periodicals, Inc.

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Akabori, K. I., Baba, D., Koguchi, K., Tanaka, K., & Nagamura, T. (2006). Relation between the adhesion strength and interfacial width for symmetric polystyrene bilayers. Journal of Polymer Science, Part B: Polymer Physics, 44(24), 3598–3604. https://doi.org/10.1002/polb.21020

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