Abstract
Quantitative measurements of lateral force required for displacement of SWNTs bundle on the surface of highly oriented pyrolytic graphite with the help of atomic force microscope (AFM) were performed "lin real time". New method of quantitative calibration of lateral forces was used for interpretation results of lateral force microscopy (LFM). It allows us to receive numerical values of adhesion force of bundle to substrate easy and without specific equipment. © 2007 Springer.
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CITATION STYLE
Baturin, A. S., Chouprik, A. A., & Sheshin, E. P. (2007). Quantitative application of lateral force microscopy for carbon nanotuces investigation. In NATO Security through Science Series A: Chemistry and Biology (pp. 415–420). https://doi.org/10.1007/978-1-4020-5514-0_51
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