Abstract
X-ray reflectivity (XRR) is widely used for observing the structure of surfaces, thin films, and multilayers on the scale of nanometers.
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CITATION STYLE
APA
Voegeli, W. (2018). X-Ray Reflectivity. In Compendium of Surface and Interface Analysis (pp. 843–848). Springer Singapore. https://doi.org/10.1007/978-981-10-6156-1_133
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