This chapter presents results on in situ deformation experiments performed either inside the scanning electron microscope or in combination with other complementary in situ characterization techniques such as digital image correlation, acoustic emission or infrared thermography. The range of materials investigated extends from austenitic CrMnNi steels enabling TRIP (TRansformation Induced Plasticity) and/or TWIP (TWinning Induced Plasticity) effect and austenitic-martensitic-carbidic CrMnNi steels after quenching and partitioning to MgO-partially stabilized zirconia and TRIP matrix composites. The performed mechanical tests include both tensile and compressive loading as well as cyclic loading in a temperature range from room temperature up to 200 °C. The great potential of the applied in situ characterization techniques is their complementarity, which is shown, in particular, by the seven case studies presented. The combination of different techniques—such as the in situ deformation within the SEM combined with the digital image correlation—has a high potential to gain a deeper understanding on strain localizations by different microstructural features such as deformation bands, twin bundles or martensitic nuclei. In addition, these complementary in situ techniques can contribute to the modelling of the deformation behavior of TRIP/TWIP steels, in particular, or for any other kind of materials with complex deformation processes. Here, the acoustic emission measurements offer, in particular, a great potential, since this is the only real time in situ characterization technique delivering bulk information with a time-resolution in the range of microseconds.
CITATION STYLE
Weidner, A., Lehnert, R., & Biermann, H. (2020). Scanning Electron Microscopy and Complementary In Situ Characterization Techniques for Characterization of Deformation and Damage Processes. In Springer Series in Materials Science (Vol. 298, pp. 485–527). Springer. https://doi.org/10.1007/978-3-030-42603-3_15
Mendeley helps you to discover research relevant for your work.