CITATION STYLE
Geiger, D., Rother, A., Linck, M., Lichte, H., Lehmann, M., Haider, M., & Freitag, B. (2009). Electron Holography with Cs-corrected Tecnai F20 — elimination of the incoherent damping introduced by the biprism in conventional electron microscopes. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 255–256). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_128
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