Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a recently developing analytical tool and a type of imaging mass spectrometry. TOF-SIMS provides mass spectral information with a lateral resolution on the order of submicrons, with widespread applicability. Sometimes, it is described as a surface analysis method without the requirement for sample pretreatment; however, several points need to be taken into account for the complete utilization of the capabilities of TOF-SIMS. In this chapter, we introduce methods for TOF-SIMS sample treatments, as well as basic knowledge of wood samples TOF-SIMS spectral and image data analysis.
CITATION STYLE
Aoki, D., & Fukushima, K. (2017). Topochemical analysis of cell wall components by TOF-SIMS. In Methods in Molecular Biology (Vol. 1544, pp. 249–256). Humana Press Inc. https://doi.org/10.1007/978-1-4939-6722-3_18
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