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Characterization and Modeling of Advanced SOI Materials and Devices

  • Allibert F
  • Pretet J
  • Ernst T
  • et al.
Springer Netherlands, (2002), 239-247
DOI: 10.1007/978-94-010-0339-1_18
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Abstract

To cite this version: Fanyu Liu. Electrical characterization and modeling of advanced SOI materials and devices. Mi-cro and nanotechnologies/Microelectronics. Université Grenoble Alpes, 2015. English. ï¿¿NNT : 2015GREAT034ï¿¿. ï¿¿tel-01216170ï¿¿

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APA

Allibert, F., Pretet, J., Ernst, T., Jomaah, J., & Cristoloveanu, S. (2002). Characterization and Modeling of Advanced SOI Materials and Devices. In Progress in SOI Structures and Devices Operating at Extreme Conditions (pp. 239–247). Springer Netherlands. https://doi.org/10.1007/978-94-010-0339-1_18

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