Terbium (III) ion-doped zironia (ZrO2:Tb3+) thin films have been directly prepared on soda-lime glass and Si wafer by the liquid phase deposition (LPD) method. The stabilization of Tb3+ ion in the LPD reaction solution, containing fluoride anions, was successfully achieved by using DTPA (diethylenetriaminepentaacetic acid) as a masking reagent. Preparation composition of ZrO2:Tb3+ thin film was determined by inductively coupled plasma-atomic emission (ICP-AES) microscopy analysis. The structural and luminescence properties for the deposited films were analyzed. After annealed at 900°C, the deposited film shows characteristic strong emission assigned to 5D4→ 7F4 of Tb3+ under CT band excitation.
CITATION STYLE
Cho, D. H., Mizuhata, M., & Deki, S. (2007). Synthesis and the luminescence property of Tb3+ doped ZrO 2 thin film by the liquid phase deposition method. Journal of the Ceramic Society of Japan, 115(1346), 608–611. https://doi.org/10.2109/jcersj2.115.608
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